Flora Li, Arokia Nathan's CCD Image Sensors in Deep-Ultraviolet: Degradation Behavior PDF

By Flora Li, Arokia Nathan

ISBN-10: 354022680X

ISBN-13: 9783540226802

I discuss with this ebook very usually and locate the knowledge actual and good written. regrettably the Kindle model has been very poorly transcribed, the font appears terrible, there are lots of areas in the midst of phrases, and plenty of unusual symbols (also frequently in the course of words). This makes the e-book very tricky to learn at the Kindle, even though in time it's attainable to to see what was once truly written.

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Additional resources for CCD Image Sensors in Deep-Ultraviolet: Degradation Behavior and Damage Mechanisms (Microtechnology and MEMS)

Example text

However, the energy of the X-ray particles is so high that they can damage the solid-state detector. The absorption characteristics of Si in the aforementioned wavelength regions are displayed in Fig. 2. 7 Pm X-Rays Gamma Rays Ultraviolet 10-8 Yellow Green Blue Violet Indigo Visible 1 nm 10-4 Microwave Infrared 1 Pm 10-2 100 Radio and Television 1 mm 102 1m 104 106 1 km 108 1010 Wavelength (Pm) Fig. 1. The electromagnetic spectrum (adapted from [17]) 1012 24 3 CCD Imaging in the Ultraviolet (UV) Regime Penetration Depth (cm) 10-2 X-Ray Visible UV IR 10-3 10-4 10-5 10-6 10-7 10-1 100 101 102 103 Wavelength (Pm) Fig.

Point defects in Si are of prime importance for three independent reasons. First, point defects are the vehicles for the important diffusion processes of dopants and other foreign atoms. 3 Si Wafers for CCDs 49 the self-interstitials or vacancies that are present in the thermal equilibrium, the diffusion of dopants in Si is much more complicated than in other elemental semiconductors and is still a subject of study. Secondly, point defects are unavoidable because they are present in thermal equilibrium.

The name is derived from that fact it is midway between deep-UV and near-UV. Near-UV is the region from 315 nm to 400 nm. It is closest to the visible portion of the electromagnetic spectrum [18]. Recently, UV light has attracted increasing attention, as the various technologies that are necessary to provide practical UV laser imaging and beam delivery systems have progressed, with considerable development in UV light sources. Historically, UV light has been available only from relatively low power lamps, thereby restricting the usefulness of this type of radiation.

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CCD Image Sensors in Deep-Ultraviolet: Degradation Behavior and Damage Mechanisms (Microtechnology and MEMS) by Flora Li, Arokia Nathan

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